Rohde & Schwarz And FormFactor Expand MeasureOne Partnership

FormFactor and Rohde & Schwarz have deepened their collaboration through a strategic co‑marketing agreement under FormFactor's MeasureOne partner program, aimed at delivering validated, turnkey on‑wafer test systems.

By pairing FormFactor's advanced wafer probing platforms with Rohde & Schwarz’s RF test instrumentation, the partners will offer integrated solutions that support workflows from early design verification through to volume production. With RF devices growing more complex and operating at ever higher frequencies, the strengthened alliance formalises a tightly integrated on‑wafer test approach designed to cut integration effort and risk, lower overall costs and accelerate time‑to‑market.

On‑wafer device characterisation for components such as 5G front ends and filters enables engineers to validate designs during development and to qualify products in production. Detecting faulty dies before packaging can improve yield and reduce cost. Through their combined solutions, Rohde & Schwarz and FormFactor aim to surface issues earlier in the process, helping manufacturers bring products to market faster.

The companies have collaborated for years to deliver seamlessly integrated test solutions. Rohde & Schwarz contributes high‑performance instruments such as the R&S ZNA, a versatile high‑end VNA capable of measuring all key RF parameters and extendable with frequency converters into the terahertz range. FormFactor complements this with a broad portfolio of manual, semi‑automated and fully automated probe stations, advanced thermal control, high‑frequency probes, precision probe positioners and robust calibration tools.

This combined approach allows performance to be verified directly during wafer runs, leveraging close hardware and software integration from both firms to enable fast, reliable testing. The complete setup spans advanced instruments, dependable wafer and die fixturing and high‑precision probe positioning across the full test cycle to strengthen confidence in product quality and performance.

Jens Klattenhoff, SVP and GM of the Systems Business Unit at FormFactor, said: "By expanding our collaboration with Rohde & Schwarz through the MeasureOne program, we are delivering integrated on‑wafer RF test solutions designed to help customers reduce risk, improve efficiency, and accelerate development. This partnership brings together advanced wafer probing and proven RF measurement technologies to address the growing complexity of next‑generation semiconductor devices."

Michael Fischlein, Vice President Spectrum & Network Analyzers, EMC and Antenna Test at Rohde & Schwarz, stated: "We are delighted to be part of MeasureOne, a strategic Co-Marketing partner program that unites FormFactor – one of the world's leading probe station providers – with Rohde & Schwarz, a global leader in test and measurement. Together, we are set up to deliver turnkey on-wafer solutions enabling crucial and demanding test capabilities for next generation semiconductors."

Under MeasureOne, the integrated solutions portfolio spans multiple Rohde & Schwarz families including the R&S ZNA, R&S ZNB, R&S ZNBT, R&S ZVA and R&S ZNL VNAs; signal and spectrum analysers such as the FSW, FSWX, R&S FSV3000 and R&S FSVA3000; and signal generators including the R&S SMA100B, R&S SMB100B, R&S SGS100A and R&S SGU100A. The offering also covers selected frontends and converters for advanced calibration workflows, operating seamlessly with FormFactor's traditional and speciality probe stations for cryogenic and vacuum applications.

rohde-schwarz.com