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OmniTek Demonstrate Eye & Jitter Analysis Solution At NAB 2007

OmniTek will demonstrate its new high-performance eye pattern and jitter analysis module, which will be on view for the first time at NAB 2007.
The new analysis module will be available as an option on the OmniTek XR, TQ and LAB systems and is designed to monitor SDI transport layer parameters.
"This new module has been designed from the ground up to support all the new and emerging serial digital video formats. This enables video engineers to precisely monitor the essential parameters of their SDI signals regardless of which format they are working in," confirms Mike Hodson, Managing Director of OmniTek.
"For broadcasters, the new eye and jitter module is equally at home in the studio or in outside broadcast environments. For post-production, the system is fully compatible with single- or dual-link HDTV and 2k formats. For R & D engineers and equipment manufacturers, we are providing all the measurement capabilities required to ensure that they are meeting the broadcast industry specifications."
The new eye and jitter module provides a wide range of advanced analysis capabilities, including high-resolution colour-mapped eye diagrams, FFT jitter spectrum analysis, cable length and jitter waveform displays. New customers can purchase the option pre-installed with the OmniTek XR, TQ, or LAB systems, and existing OmniTek customers have the option to upgrade.
"Our new eye and jitter module provides the kind of market-leading features that the broadcast industry has come to expect from OmniTek," continued Hodson.
"Interest is strong and we have already received many customer orders. Once again we are taking the technology to a new level, in order to provide our customers with measurement performance that is unmatched in the industry."
See OmniTek at NAB booth SL9705 or visit
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