Rohde & Schwarz To Host Power Electronics Online Conference 'From Design to Validation'

Rohde & Schwarz will stage its Power Electronics Online Conference 'From Design to Validation' on 5 and 6 May 2026, offering engineers practical guidance on testing challenges driven by tighter efficiency targets, rising power densities and closer integration with large-scale grids. Sessions will present measurement‑centric solutions using modern oscilloscopes, vector network analysers and precision power analysers to address non‑ideal component behaviour, fast transients in wide‑bandgap devices and demanding EMC requirements.

The programme opens on 5 May with a keynote from Tobias Keller (Hitachi Energy) entitled "Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades". He will discuss qualification of silicon and silicon carbide (SiC) devices for high‑voltage grid applications, with emphasis on thermal cycling, short‑circuit robustness and long‑term reliability data.

second keynote on 6 May, delivered by Veit Hellwig (Infineon Technologies), will examine the impact of gallium‑nitride (GaN) technology on high‑voltage motor inverter topologies.

Beyond the keynotes, technical sessions will delve into passive component characterisation, outlining methods to extract parasitic inductance and capacitance above 100 MHz and demonstrating how these non‑idealities influence converter stability. Another talk will cover automated dynamic characterisation of SiC and GaN power devices, showing how double‑pulse test rigs can be synchronised with high‑speed digitisers to cut measurement uncertainty and capture fast recovery behaviour.

Electromagnetic compatibility is addressed in two dedicated presentations. One offers practical guidance on using near‑field probes to pinpoint radiated emission sources and to validate EMI filter designs. The other demonstrates a complete conducted‑emission workflow on a small‑scale prototype using a Line Impedance Stabilization Network (LISN) with a modern mixed‑signal oscilloscope, and outlines a filter design methodology that leverages the instrument's time‑frequency capabilities.

Another webinar focuses on accurate efficiency measurements for data centre and AI server power supplies. Using precision power analysers capable of tracking distorted waveforms and rapid load transients, attendees will learn how to obtain true input and output power values that meet 80 PLUS certification requirements.

The final session reviews harmonic current and voltage flicker compliance for low‑voltage, grid‑connected products. It will cover limits and test procedures specified in IEC/EN 61000‑3‑2/-3‑3 and IEC/EN 61000‑3‑12/-3‑11, and demonstrate how integrated compliance testing software linked to a power analyser can deliver automated pass/fail decisions from early prototyping through to final type approval.

Speakers include subject‑matter experts from Rohde & Schwarz, Hitachi, Infineon, PE‑Systems, Würth Elektronik, and the Universities of Bremen and Zaragoza. Their contributions blend academic insight with industrial experience to provide both theoretical context and hands‑on measurement strategies.

Attendance is free, with registration required. The full agenda, speaker biographies and the registration portal are available at: www.rohde-schwarz.com/power-electronics-conference